ATTENTION ⚠️
In observance of a holiday, Agilent CrossLab/iLab Operations Software Support Help Desk will be closed during U.S. hours on Friday, July 4th, 2025. We will resume regular U.S. support hours on Monday, July 7th, 2025. EU and APAC Support will remain open during this time. For urgent matters, please add "Urgent" to the ticket/email subject or press "1" when prompted to escalate a call on the iLab Support phone, and we will prioritize those requests first.
The Analytical Imaging Facility (AIF) provides state of the art methods in modern light and electron microscopy imaging to biomedical scientists with all levels of expertise.
Available techniques include:
For more infomation please visit the AIF web page.
Staffed Hours: Monday - Friday 8:00 AM - 6:00 PM
Operating Hours: 24/7 Access for trained users
Location: Forchheimer 639 & 641, Price 210 & 216
Name | Role | Phone | Location | |
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Frank Macaluso M.Sc |
Administrative Director and Director of Electron Microscopy
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718.430.3547
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frank.macaluso@einsteinmed.edu
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Forchheimer 641
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Vera DesMarais Ph.D |
Director of Light Microscopy
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718.430.3547
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vera.desmarais@einsteinmed.edu
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Forchheimer 641
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Services |
► EM Sample Prep: embed (6) | |||
Name | Description | Price | |
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Embedding 01-4 | Inquire | ||
Embedding 05-9 | Inquire | ||
Embedding 10-14 | Inquire | ||
Embedding 15-19 | Inquire | ||
Embedding 20+ | Inquire | ||
Freeze Substitution | Inquire | ||
► EM Sample Prep: section (9) | |||
Name | Description | Price | |
ARTOS serial sectioning | Inquire | ||
Thin Sectioning | Inquire | ||
Thin Sectioning special | Inquire | ||
Thick Sectioning | Inquire | ||
Thick Sectioning special | Inquire | ||
Cryo thin sectioning | Inquire | ||
Cryo thick sectioning | Inquire | ||
Cryo thin section special | Inquire | ||
ATUM section | Inquire | ||
► EM Sample Prep: TEM (6) | |||
Name | Description | Price | |
Negatives | Inquire | ||
Immunogold labeling, 1-6 grids | Inquire | ||
Immunogold labeling, 7-12 grids | Inquire | ||
Metal evaporation | Inquire | ||
Glow discharge | Inquire | ||
Negative staining | Inquire | ||
► EM Sample Prep: SEM (4) | |||
Name | Description | Price | |
Immuno Labeling SEM, 1-2 samples | Inquire | ||
Fix & dehydrate | Inquire | ||
Critical point drying | Inquire | ||
Sputter coating | Inquire | ||
► EM Sample Prep: cryo (6) | |||
Name | Description | Price | |
High Pressure Freezing set up | Inquire | ||
High Pressure Freezing | Inquire | ||
Cryo fix & embed | Inquire | ||
Vitrobot freezing | Inquire | ||
Freeze fracture / rotary shadowing | Inquire | ||
Slam Freezing | Inquire | ||
► Staff Services (3) | |||
Name | Description | Price | |
On Site Microscopy | Inquire | ||
On Site Microscopy Cleaning Optics | Inquire | ||
Thin section training | Inquire | ||
► Supplies (2) | |||
Name | Description | Price | |
Carbon coated grids | Inquire | ||
Grids | Inquire | ||
► Unassisted Sample Prep (1) | |||
Name | Description | Price | |
Vitrobot freezing (Unassisted) | Inquire | ||
► External Quotes (15) | |||
Name | Description | Price | |
computer image analysis | Inquire | ||
Image Analysis | Inquire | ||
JEOL 1400 Plus unassisted | Inquire | ||
JEOL TEM scope assisted | Inquire | ||
Leica SP8 Confocal Assisted | Inquire | ||
Leica SP8 Confocal training | Inquire | ||
Leica SP8 Confocal unassisted | Inquire | ||
Nikon Super Resolution microscope Assisted | Inquire | ||
Nikon Super Resolution Microscope extended use | Inquire | ||
Nikon Super Resolution Microscope training | Inquire | ||
P-250 slide scanner assisted | Inquire | ||
Vitrobot Sample Freezing - Assisted | Inquire | ||
Zeiss Supra 40 extended use | Inquire | ||
Zeiss Supra 40 SEM assisted | Inquire | ||
Zeiss Supra 40 unassisted | Inquire |
► Confocal Microscopes (4) | |||||||||||||||||||||||||||||||||||||||
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► Decommissioned (12) | |||||||||||||||||||||||||||||||||||||||
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► Digital Light Microscopes (5) | |||||||||||||||||||||||||||||||||||||||
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► Image Analysis (7) | |||||||||||||||||||||||||||||||||||||||
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► Laser Capture Microdissection Microscope (1) | |||||||||||||||||||||||||||||||||||||||
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► Multiphoton Microscope (1) | |||||||||||||||||||||||||||||||||||||||
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► Scanners (5) | |||||||||||||||||||||||||||||||||||||||
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► Scanning Electron Microscope (1) | |||||||||||||||||||||||||||||||||||||||
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► Specimen Prep Equipment (4) | |||||||||||||||||||||||||||||||||||||||
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► Super Resolution Microscope (1) | |||||||||||||||||||||||||||||||||||||||
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► Transmission Electron Microscopes (3) | |||||||||||||||||||||||||||||||||||||||
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