ALERT

The final week of February, 2019 (Feb. 25 - Mar 1), iLab Operations Software will be conducting an internal event and will be staffed at significantly reduced levels. iLab Support will prioritize critical issues first (i.e. issues that prevent key workflows from completing) and to escalate an issue, please add "Urgent" to the ticket/ email subject or press "1", when prompted, on the iLab Support phone (regional numbers can be found here). Regular support tickets will be monitored periodically and processed in order of submission starting March 4th, 2019. During this time, you can also refer to the iLab Help Site and iLab Status Page for site information. Please note that this will not affect standard Core Facility Operations.

Analytical Imaging Facility (AIF)

Overview of Services

The Analytical Imaging Facility (AIF) provides state of the art methods in modern light and electron microscopy imaging to biomedical scientists with all levels of expertise.

Available techniques include:  

  • Electron microscopy: TEM, SEM, and sample preparation
  • Light microscopy: confocal, multiphoton, fluorescence, and bright-field imaging
  • Image analysis: Volocity, Imaris, and ImageJ

For more infomation please visit the AIF web page.

Location and Hours of Operation

Staffed Hours: Monday - Friday 8:00 AM - 6:00 PM

Operating Hours: 24/7 Access for trained users

Location: Forchheimer 641, Price 2nd floor

Contacts

Name Role Phone Email Location
Frank Macaluso M.Sc
Administrative Director and Director of Electron Microscopy
 
718.430.3547
 
frank.macaluso@einstein.yu.edu
 
Forchheimer 641
 
Vera DesMarais Ph.D
Co-Director of Light Microscopy and Image Analysis
 
718.430.3547
 
vera.desmarais@einstein.yu.edu
 
Forchheimer 641
 
Peng Guo Ph.D
Co-Director of Light Microscopy and Image Analysis
 
718.430.3547
 
peng.guo@einstein.yu.edu
 
Forchheimer 641
 

Available Equipment and Resources

Confocal Microscopes (3)
Decommissioned (3)
Digital Light Microscopes (8)
Image Analysis (5)
Laser Capture Microdissection Microscope (1)
Multiphoton Microscope (1)
Scanners (3)
Scanning Electron Microscope (1)
Specimen Prep Equipment (6)
Super Resolution Microscope (1)
Transmission Electron Microscopes (3)